Probe Stations & Systems - Page 5

47 Probe Stations & Systems from 8 Manufacturers meet your specification.
Description:300 mm Semi-/ Fully-automated Probe System
Type:
Automatic
Frequency:
DC to 2.5 Hz
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
Description:Manual Probe System
Type:
Manual, Semi Automatic
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck Travel Range:
1200 x 650 x 900 mm
Chuck Travel Resolution:
5 µm
Microsope Movement Range:
50 x 50 mm
more info
Description:200 mm Semi-/ Fully-automated Probe System
Type:
Manual
Measurements Type:
DC, RF
Chuck Size:
200 mm
Chuck to Platen Height:
32 mm
Chuck Travel Range:
205 x 205 mm
Chuck Travel Resolution:
0.5 µm
more info
Description:150 mm Fully Automatic Probe System
Type:
Automatic
Measurements Type:
DC, RF
Chuck Size:
150 mm
Chuck Travel Range:
155 x 155 mm
Chuck Travel Resolution:
0.1 µm
Microscope Travel Resolution:
0.5 µm
Microsope Movement Range:
15 mm
more info
Description:300 mm Semi-/ Fully-automated Probe System with Autonomous Silicon Photonics Measurement Assistant
Type:
Manual
Frequency:
DC to 2.5 Hz
Measurements Type:
DC, RF
Chuck Size:
300 mm
Chuck to Platen Height:
43 mm
Chuck Travel Range:
301 x 501 mm
Chuck Travel Resolution:
0.2 µm
Microscope Travel Resolution:
0.2 µm
Microsope Movement Range:
10 mm
Connectors:
BNC
more info
Description:200 mm Manual Probe Station & System for mmWave, THz and Load-Pull Applications
Type:
Automatic
Frequency:
Up to 110 GHz
Measurements Type:
RF
Chuck Size:
200 mm
Chuck Travel Range:
200 mm
Microsope Movement Range:
150 x 100 mm
more info
Description:300 mm Manual Probe System
Measurements Type:
RF
Chuck Size:
300 mm
Chuck Travel Range:
300 x 300 mm
Microsope Movement Range:
40 mm
more info

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